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/A\V/>:<_ |="">The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
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4
C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test NP0 Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specified tolerance
<30 pF: Q≥ 400+20 x Cap Value
≥30 pF: Q≥ 1000
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
1.0 kHz ± 10% for cap > 1000 pF
Voltage: 1.0Vrms ± .2V
Q
Insulation Resistance 100,000MΩ or 1000MΩ - µF,
whichever is less
Charge device with rated voltage for 60 ± 5 secs
@ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for 1-5
seconds, w/charge and discharge current limited
to 50 mA (max)
Note: Charge device with 150% of rated voltage
for 500V devices.
Resistance to
Flexure
Stresses
Appearance No defects
Deflection: 2mm
Test Time: 30 seconds
Capacitance
Variation ±5% or ±.5 pF, whichever is greater
QMeets Initial Values (As Above)
Insulation
Resistance ≥ Initial Value x 0.3
Solderability ≥ 95% of each terminal should be covered
with fresh solder
Dip device in eutectic solder at 230 ± 5ºC for 5.0 ±
0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for
60sec- onds. Store at room temperature
for 24 ± 2hours before measuring electrical
properties.
Capacitance
Variation ≤ ±2.5% or ±.25 pF, whichever is greater
QMeets Initial Values (As Above)
Insulation
Resistance Meets Initial Values (As Above)
Dielectric
Strength Meets Initial Values (As Above)
Thermal Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation ≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes
QMeets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength Meets Initial Values (As Above) Repeat for 5 cycles and measure after
24 hours at room temperature
Load Life
Appearance No visual defects
Charge device with twice rated voltage in test
chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0).
Remove from test chamber and stabilize at
room temperature for 24 hours
before measuring.
Capacitance
Variation ≤ ±3.0% or ± .3 pF, whichever is greater
Q
(C=Nominal Cap)
≥ 30 pF: Q≥ 350
≥10 pF, <30 pF: Q≥ 275 +5C/2
<10 pF: Q≥ 200 +10C
Insulation
Resistance ≥ Initial Value x 0.3 (See Above)
Dielectric
Strength Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±
5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Capacitance
Variation ≤ ±5.0% or ± .5 pF, whichever is greater
Q
≥ 30 pF: Q≥ 350
≥10 pF, <30 pF: Q≥ 275 +5C/2
<10 pF: Q≥ 200 +10C
Insulation
Resistance ≥ Initial Value x 0.3 (See Above)
Dielectric
Strength Meets Initial Values (As Above)
051818